This phenomenon is caused by the increase in oxides on the surface of the sample 26. For NiO500 and NiO700, XPS spectra of Ni (2p) core level are shown in Figure 7a and b, while the XPS spectra for NiO400 and NiO1100 are shown in Figure 8. Compared with the XPS spectrum after 4 h of electrolysis, the 2p peak of Ni after 10 h of electrolysis is weaker and wider, while the 2p peak of part of Ni 2+ is strengthened. The chemical properties and stoichiometry of nickel oxide were studied by XPS analysis. The sp2 peak, characteristic of aromatic carbon, features a strong asymmetry that changes with the curvature of the sample surface and, thus, cannot be neglected in spectral analysis. 5.4 XPS studies of nonstoichiometric nickel oxide. A well-resolved Co2p spectrum for metal shows complex structure. Co2p peaks have asymmetric shape for metal. These findings illustrate that both spectral line shapes and binding energy components must be considered in the analysis of potentially defective surfaces of carbon materials. Co2p peak has significantly split spin-orbit components ( metal 14.99eV) Co2p region overlaps some of its own weaker Co LMM Auger peaks and care must be taken not to misinterpret the peak as an XPS peak. With high-resolution XPS and XPS depth profiling, the spectral components arising from disordered carbon and surface-defect states can be distinguished from aromatic sp2 carbon. Controlled manipulation of such samples is performed by annealing, sputtering, and oxygen functionalization to identify different CC bonding states and assess the impact of the manipulations on spectral line shapes and their binding energy positions.
In this work, an overview of extrinsic and intrinsic effects that influence the C 1s XPS spectra-for example, photon broadening or carbon–catalyst interaction-of various graphitic samples is presented. The chemical states of elements were determined from XPS spectra by. However, the analysis of XPS data-in particular the C 1s region-can be complex, impeding a straightforward evaluation of the data. characterize a thin film of NiFe oxyhydroxide electrodeposited on Au as the working. X-ray photoelectron spectroscopy (XPS) is a widely used technique for characterizing the chemical and electronic properties of highly ordered carbon nanostructures, such as carbon nanotubes and graphene.